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Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
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10.1063/1.2977865
/content/aip/journal/apl/93/9/10.1063/1.2977865
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2977865
/content/aip/journal/apl/93/9/10.1063/1.2977865
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/content/aip/journal/apl/93/9/10.1063/1.2977865
2008-09-02
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2977865
10.1063/1.2977865
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