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Terahertz emission from black silicon
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10.1063/1.2978096
/content/aip/journal/apl/93/9/10.1063/1.2978096
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2978096
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

BS sample imaged with a scanning electron microscope. Left: black silicon: right: damaged sample.

Image of FIG. 2.
FIG. 2.

Experimental setup. Left: BS emitter in quasitransmission; middle: quasireflection geometry; right: possible photon paths.

Image of FIG. 3.
FIG. 3.

Terahertz electric field for different surface qualities: black, damaged, unpolished (sawed), and polished.

Image of FIG. 4.
FIG. 4.

Angle dependent terahertz emission in quasitransmission geometry. Inset: terahertz output of BS and InAs for different pump polarizations, both plots normalized.

Image of FIG. 5.
FIG. 5.

Terahertz output of BS for different angles in quasireflection. Inset: pump power dependence of the terahertz emission.

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/content/aip/journal/apl/93/9/10.1063/1.2978096
2008-09-03
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Terahertz emission from black silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2978096
10.1063/1.2978096
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