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(a) Schematic illustration of the dual scan technique of EFM and (b) the corresponding phase changes with respect to the driving signal (Courtesy of Asylum Research). (c) SEM image of the SWNT FET and (d) EFM phase image of the channel while , the source grounded and the gate floating. during the interleave scan.
(a) Experimental setup with dc bias applied to the drain, the gate grounded and the source floating, during the interleave scan, and charging images and cross section profiles when (b) and (c) .
(a) Phase shift as a function of time at different distances away from the SWNT for , showing the accumulation of charges over time. (b) Phase shift as a function of distance from the SWNT. Inset of (b) shows the extension of the charged area as a function of time.
(a) Room temperature discharging images taken at 0, 3, and 6 min after ( for 10 min) is turned off to show the diffusion of injected charges. (b) Cross section profiles show the movement of surface charge density peak. (c) The peak position as a function of time at different temperatures ranging from 80 to . Inset shows the opposite trend from 30 to . (d) Plot of , being the speed of the peak movement, as a function of reveals an activation energy of .
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