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Charge injection at carbon nanotube- interface
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10.1063/1.2978249
/content/aip/journal/apl/93/9/10.1063/1.2978249
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2978249
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic illustration of the dual scan technique of EFM and (b) the corresponding phase changes with respect to the driving signal (Courtesy of Asylum Research). (c) SEM image of the SWNT FET and (d) EFM phase image of the channel while , the source grounded and the gate floating. during the interleave scan.

Image of FIG. 2.
FIG. 2.

(a) Experimental setup with dc bias applied to the drain, the gate grounded and the source floating, during the interleave scan, and charging images and cross section profiles when (b) and (c) .

Image of FIG. 3.
FIG. 3.

(a) Phase shift as a function of time at different distances away from the SWNT for , showing the accumulation of charges over time. (b) Phase shift as a function of distance from the SWNT. Inset of (b) shows the extension of the charged area as a function of time.

Image of FIG. 4.
FIG. 4.

(a) Room temperature discharging images taken at 0, 3, and 6 min after ( for 10 min) is turned off to show the diffusion of injected charges. (b) Cross section profiles show the movement of surface charge density peak. (c) The peak position as a function of time at different temperatures ranging from 80 to . Inset shows the opposite trend from 30 to . (d) Plot of , being the speed of the peak movement, as a function of reveals an activation energy of .

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/content/aip/journal/apl/93/9/10.1063/1.2978249
2008-09-05
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Charge injection at carbon nanotube-SiO2 interface
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2978249
10.1063/1.2978249
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