No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Shape transition in very large germanium islands on Si(111)
21.U. D. Lanke, A. P. Hitchcock, P. Hitchcock, J. S. Ornstein, K. Kaznatcheev, A. Kolmakov, I. Annesley, A. McCready, and S. G. Urquhart, IPAP Conf. Ser. 7, 85 (2006).
22.I. Horcas, R. Fernandez, J. M. Gomez-Rodriguez, J. Colchero, J. Gomez-Herrero, and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007).
24.The islands exhibit the threefold symmetry of the Si substrate and have apexes extending along . The individual branches of the ramified islands similarly align roughly along these directions.
25.The temperature dependence of the island shape was not rigorously determined in this study, since the size and shape of the islands on each sample varied over each sample due to heating inhomogeneities introduced by the sample holder.
27.Although XPEEM images are not strictly topographic, in our view, these images are indicative of topography due to the high x-ray energy and based on comparison with AFM images of the same samples.
30.These islands are considerably taller than the flat, compact islands observed at lower growth temperatures, such as the 8 nm tall, 70 nm wide islands grown at (Ref. 2).
33.F. Montalenti, P. Raiteri, D. B. Migas, H. von Känel, A. Rastelli, C. Manzano, G. Costantini, U. Denker, O. G. Schmidt, K. Kern, and L. Miglio, Phys. Rev. Lett. 93, 216102 (2004).
36.U. Denker, A. Rastelli, M. Stoffel, J. Tersoff, G. Katsaros, G. Costantini, K. Kern, N. Y. Jin-Phillipp, D. E. Jesson, and O. G. Schmidt, Phys. Rev. Lett. 94, 216103 (2005).
37.We were unable to carry out full quantitative XPS mapping due to the relatively large focused spot size at the SM beamline of the CLS.
Article metrics loading...
Full text loading...
Most read this month