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Typical TOF spectra recorded for 5 nm Ni film at various angles. Plume features divided into two parts P1 and P2, separated at point D. Fast negative signals due to fast electrons (inset).
Angular distribution of total integrated ion signal for range of film thicknesses, note separate scale for 0.5 nm.
Whole trace (triangles), P1 (circles) and P2 (squares) vs (initial plasma dimension): Fit to the data (solid line) as calculated from (Eq. 9) in Ref. 6.
Total ion yields and values of for a range of film thicknesses .
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