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Spatially resolved doping concentration measurement in semiconductors via spin noise spectroscopy
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10.1063/1.3098074
/content/aip/journal/apl/94/11/10.1063/1.3098074
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/11/10.1063/1.3098074
/content/aip/journal/apl/94/11/10.1063/1.3098074
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/content/aip/journal/apl/94/11/10.1063/1.3098074
2009-03-16
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spatially resolved doping concentration measurement in semiconductors via spin noise spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/11/10.1063/1.3098074
10.1063/1.3098074
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