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Schematic representation of (a) slanted evaporation geometry and (b) spatially variable multilayer filter structure. (c) Cross-sectional scanning electron micrograph of the 20 layer multilayer structure. The dark layers correspond to layers with a cavity layer.
Measured index of refraction and extinction coefficient of (a) thermally evaporated and (b) thin films. The refractive index contrast allows to achieve omnidirectional photonic band gap.
(a) Position dependent reflectance measurements taken from 80 linearly spaced positions along the sample. (b) Comparison of theoretical and experimental reflectance spectra taken at a position 4 cm away from the short-wavelength side of the filter. Both the simulation and FTIR measurements are performed at normal incidence.
Calculated reflectance spectra of the omnidirectional filter as a function of wavelength for TM and TE polarizations for all angles of incidence at a position having the band gap centered around .
Measured reflectance spectra of the filter as a function of wavelength for (red lines) TE and (black lines) TM polarization modes at (a) 40°, (b) 60°, and (c) 80° angles of incidence.
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