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Introduction of molecular scale porosity into semicrystalline polymer thin films using supercritical carbon dioxide
6.T. Koga, Y. S. Seo, Y. M. Zhang, K. Shin, K. Kusano, K. Nishikawa, M. H. Rafailovich, J. C. Sokolov, B. Chu, D. Peiffer, R. Occhiogrosso, and S. K. Satija, Phys. Rev. Lett. 89, 125506 (2002).
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12.Based on the Fourier Transform analysis method for XR (Ref. 8), we found that the film (II) was comprised of two layers with different densities. Hence, a four-layer model, i.e., a Si substrate, a SiO2 layer and two PPV layers, was used to analyze the XR data for the film (II), while a three-layer model used for the homogenous films (I) and (III).
14.Note that the deviation between the observed and calculated SAXS profiles at may be attributed to the fact that the shape of the pores is not spherical but more elongated.
15.In order to fit the data, the same three-layer model used for the XR analysis was utilized with the literature values for a layer and Si substrate. Since the film thicknesses of both PPV and layers could be determined by XR, the only floating parameter was the value of the PPV layer.
16.M. Born and E. Wolf, In Principles of Optics (Cambridge University Press, Cambridge, 1999).
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