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Ultralow dielectric losses in pyrochlore films of the system
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10.1063/1.3106107
/content/aip/journal/apl/94/12/10.1063/1.3106107
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/12/10.1063/1.3106107
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD scans of the PMNT thin films, annealed at different temperatures. The diffraction peaks can be well indexed to a pyrochlore phase structure.

Image of FIG. 2.
FIG. 2.

Relative dielectric constant and loss tangent as functions of the applied dc bias voltage for the PMNT thin films annealed at different temperatures: (a) , (b) , (c) , and (d) .

Image of FIG. 3.
FIG. 3.

(a) Frequency dependence, measured at room temperature and (b) temperature dependence, measured at 100 kHz, of the dielectric constant and loss tangent for the PMNT thin film annealed at .

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/content/aip/journal/apl/94/12/10.1063/1.3106107
2009-03-25
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultralow dielectric losses in pyrochlore films of the PbO–MgO–Nb2O5–TiO2 system
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/12/10.1063/1.3106107
10.1063/1.3106107
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