1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Josephson current in nanofabricated V/Cu/V mesoscopic junctions
Rent:
Rent this article for
USD
10.1063/1.3114522
/content/aip/journal/apl/94/13/10.1063/1.3114522
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/13/10.1063/1.3114522

Figures

Image of FIG. 1.
FIG. 1.

(a) Scanning electron micrograph showing the blowup of a V/Cu/V weak link in a typical device (sample B). (b) Sketch of the measurement setup. (c) Zero-bias resistance vs temperature for sample A.

Image of FIG. 2.
FIG. 2.

Current vs voltage characteristics of all samples at three different representative temperatures. The curves are horizontally offset for clarity.

Image of FIG. 3.
FIG. 3.

Critical current vs for all four devices. Full dots and dashed lines represent the switching current and the high-temperature fit, respectively. The retrapping current is also shown as open squares.

Tables

Generic image for table
Table I.

Sample parameters. The junctions total length , width , and normal-state resistance are shown. The experimental Thouless energy is determined from and the samples geometrical dimensions (Ref. 17). The superconducting gap is for all samples. and the suppression coefficient are fit parameters of Fig. 3 (see text).

Loading

Article metrics loading...

/content/aip/journal/apl/94/13/10.1063/1.3114522
2009-04-02
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Josephson current in nanofabricated V/Cu/V mesoscopic junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/13/10.1063/1.3114522
10.1063/1.3114522
SEARCH_EXPAND_ITEM