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In situ STM images. (a) thin film after annealing, (b) 18 Å Al deposited on a aged surface, and (c) 18 Å Al deposited on a fresh surface.
Upper image: in situ STM image of 2.5 Å Mg seed layer on a surface. Lower image: height profile along the yellow line indicated in the upper image.
In situ STM images of 18 Å of rf-sputtered Al on (a) 2.5, (b) 5.0, and (c) 7.5 Å of Mg on thin films.
Dependence of the TMR on the Mg layer thickness of tunneling junctions. The inset shows the magnetoresistance loop of the junction with a Mg thickness of 2.5 Å.
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