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Single-crystal-like organic heterojunction with 40 nm thick charge accumulation layers
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1.
1.C. W. Tang, Appl. Phys. Lett. 48, 183 (1986).
http://dx.doi.org/10.1063/1.96937
2.
2.C. W. Tang and S. A. Vanslyke, Appl. Phys. Lett. 51, 913 (1987).
http://dx.doi.org/10.1063/1.98799
3.
3.P. Peumans and S. R. Forrest, Appl. Phys. Lett. 79, 126 (2001).
http://dx.doi.org/10.1063/1.1384001
4.
4.A. Dodabalapur, H. E. Katz, L. Torsi, and R. C. Haddon, Science 269, 1560 (1995).
http://dx.doi.org/10.1126/science.269.5230.1560
5.
5.J. Wang, H. Wang, X. Yan, H. Huang, and D. Yan, Appl. Phys. Lett. 87, 093507 (2005).
http://dx.doi.org/10.1063/1.2037204
6.
6.H. Alves, A. S. Molinari, H. Xie, and A. F. Morpurgo, Nature Mater. 7, 574 (2008).
http://dx.doi.org/10.1038/nmat2205
7.
7.X. Yan, J. Wang, H. Wang, H. Wang, and D. Yan, Appl. Phys. Lett. 89, 053510 (2006).
http://dx.doi.org/10.1063/1.2227714
8.
8.J. Dai, X. Jiang, H. Wang, and D. Yan, Thin Solid Films 516, 3320 (2008).
http://dx.doi.org/10.1016/j.tsf.2007.09.043
9.
9.J. Wang, H. Wang, X. Yan, H. Huang, and D. Yan, Chem. Phys. Lett. 407, 87 (2005).
http://dx.doi.org/10.1016/j.cplett.2005.03.072
10.
10.H. Wang, J. Wang, X. Yan, J. Shi, H. Tian, Y. Geng, and D. Yan, Appl. Phys. Lett. 88, 133508 (2006).
http://dx.doi.org/10.1063/1.2190445
11.
11.J. Shi, H. Wang, D. Song, H. Tian, Y. Geng, and D. Yan, Adv. Funct. Mater. 17, 397 (2007).
http://dx.doi.org/10.1002/adfm.200600950
12.
12.C. Videlot-Ackermann, J. Achermann, and F. Fages, Synth. Met. 157, 551 (2007).
http://dx.doi.org/10.1016/j.synthmet.2007.06.002
13.
13.S. L. Lai, M. Y. Chan, M. K. Fung, C. S. Lee, and S. T. Lee, J. Appl. Phys. 101, 014509 (2007).
http://dx.doi.org/10.1063/1.2426338
14.
14.B. Yu, F. Zhu, H. Wang, G. Li, and D. Yan, J. Appl. Phys. 104, 114503 (2008).
http://dx.doi.org/10.1063/1.3033485
15.
15.C. D. Dimitrakopoulos, A. R. Brown, and A. J. Pomp, J. Appl. Phys. 80, 2501 (1996).
http://dx.doi.org/10.1063/1.363032
16.
16.Z. Bao, A. J. Lovinger, and A. Dodabalapur, Appl. Phys. Lett. 69, 3066 (1996).
http://dx.doi.org/10.1063/1.116841
17.
17.Z. Bao, A. J. Lovinger, and A. Dodabalapour, Adv. Mater. (Weinheim, Ger.) 9, 42 (1997).
http://dx.doi.org/10.1002/adma.19970090108
18.
18.V. Podzorov, E. Menard, J. A. Rogers, and M. E. Gershenson, Phys. Rev. Lett. 95, 226601 (2005).
http://dx.doi.org/10.1103/PhysRevLett.95.226601
19.
19.D. Kurrle and J. Pflaum, Appl. Phys. Lett. 92, 133306 (2008).
http://dx.doi.org/10.1063/1.2896654
20.
20.H. Wang, F. Zhu, J. Yang, Y. Geng, and D. Yan, Adv. Mater. (Weinheim, Ger.) 19, 2168 (2007).
http://dx.doi.org/10.1002/adma.200602566
21.
21.F. Zhu, H. Wang, D. Song, K. Lou, and D. Yan, Appl. Phys. Lett. 93, 103308 (2008).
http://dx.doi.org/10.1063/1.2980023
22.
22.H. Wang, J. Wang, H. Huang, X. Yan, and D. Yan, Org. Electron. 7, 369 (2006).
http://dx.doi.org/10.1016/j.orgel.2006.04.004
23.
23.G. Horowitz, R. Hajlaoui, H. Bouchriha, R. Bourguiga, and M. Hajlaoui, Adv. Mater. (Weinheim, Ger.) 10, 923 (1998).
http://dx.doi.org/10.1002/(SICI)1521-4095(199808)10:12<923::AID-ADMA923>3.0.CO;2-W
24.
24.G. Horowitz, J. Mater. Res. 19, 1946 (2004).
http://dx.doi.org/10.1557/JMR.2004.0266
25.
25.K. M. Lau, J. X. Tang, H. Y. Sun, C. S. Lee, S. T. Lee, and D. Yan, Appl. Phys. Lett. 88, 173513 (2006).
http://dx.doi.org/10.1063/1.2198484
26.
26.N. Shi and R. Ramprasad, Appl. Phys. Lett. 89, 102904 (2006).
http://dx.doi.org/10.1063/1.2339037
27.
27.K. C. Kao and W. Hwang, Electrical Transport in Solids: With Particular Reference to Organic Semiconductors (Pergamon, New York, 1981).
28.
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Figures

Image of FIG. 1.

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FIG. 1.

AFM images of WEG heterojunction films (a) and normal heterojunction films (b). (All ). (c) Conductance in parallel direction. The channel length is and the width is .

Image of FIG. 2.

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FIG. 2.

(a) curves of field-effect transistors with different thickness of CuPc. and . (b) curves of field-effect transistors corresponding to 5 and 37 nm layer. (c) The accumulation layer thickness and average density of carriers has a relationship with the films’ quality.

Image of FIG. 3.

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FIG. 3.

curves of CuPc diodes. The diameter of circular electrode is 2 mm.

Tables

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Table I.

Accumulation thickness of several kinds of phthalocyanine compounds.

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/content/aip/journal/apl/94/14/10.1063/1.3118581
2009-04-10
2014-04-23

Abstract

Single-crystal-like organic heterojunctionfilms of copper phthalocyanine (CuPc) and copper-hexadecafluoro-phthalocyanine were fabricated by weak-epitaxy-growth method. The intrinsic properties of organic heterojunction were revealed through threshold voltage shift of field-effect transistors and measurement of single-crystal-like diodes. At both sides of the heterojunction interface 40 nm thick charge accumulation layers formed, which showed that the long carriers’ diffusion length is due to the high crystallinity and low density of deep bulk traps of single-crystal-like films. This also indicated the electronic properties of organic heterojunction can be adjusted by controlling the growth condition.

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Scitation: Single-crystal-like organic heterojunction with 40 nm thick charge accumulation layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/14/10.1063/1.3118581
10.1063/1.3118581
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