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Metallic-like photoluminescence and absorption in fused silica surface flaws
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10.1063/1.3119622
/content/aip/journal/apl/94/15/10.1063/1.3119622
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/15/10.1063/1.3119622
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

CTP images of scattering and photoluminescence from damage-prone silica surface flaws. (a) Laser damage site. (b) 2 N silica indentation (surface view). (c) Plane through surface along green arrow in (a). Blue arrow: surface; green arrow: subsurface fracture. (d) 0.5 N silica indentation. (e) laser-heated pit (after damage testing). Green arrow: laser damaged area.

Image of FIG. 2.
FIG. 2.

Photoluminescence lifetime decays of damage-prone silica surface flaws (integrated over entire flaw; red, green), silver nanoparticles (black), and the NBOHC (calculated from fit; blue).

Image of FIG. 3.
FIG. 3.

(a) Image of fitted amplitudes of fast PL (0.04 and 0.2 ns components) in laser-heated pit, formed from image in Fig. 1(e). Green arrow: laser damaged area. (b) Long lifetime components from feature in (a).

Image of FIG. 4.
FIG. 4.

Laser damage measurements using a 3 ns, 351 nm laser demonstrate the link between strong absorption and the fast PL. (a) 0.5 N silica indentation before [left, fast PL image formed from image in Fig. 1(d)] and after (right, light microscopy) laser damage. [(b) and (c)] Total PL images of treated 0.5 N silica indentations after: 5 min BOE etch (b), , 48 h anneal (c). Compare with Fig. 1(d). (d) Maximum fast PL count rate vs laser damage thresholds for the silica surface flaws with the range of values shown as width and height, intersecting at the mean (black). Indentation loads from 0.5 to 10 N and BOE etch or anneal are noted on graph. Maximum slow PL count rate shown in gray.

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/content/aip/journal/apl/94/15/10.1063/1.3119622
2009-04-17
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Metallic-like photoluminescence and absorption in fused silica surface flaws
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/15/10.1063/1.3119622
10.1063/1.3119622
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