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Schematic plot of the twist defect introduced in the CE helix.
Circularly copolarized reflectances right- (solid line) and left-handed (dashed line) vs wavelength for a CE distorted with a chiral twist defect of 90° for and (a) and (b) at resonant wavelength of 632 nm. The dielectric ordinary and extraordinary constants are and . Other parameters are and sample thickness .
(a) Circularly copolarized reflectances , (solid line), transmittances , and (dashed line) vs at the resonant wavelength for high chemical cross-linked density where and . (b) Inverse linewidth at resonant wavelength for right and (c) left circularly polarized light as function of for and (dotted line), 0.3 (dashed line), and 0.8 (continuous line) corresponding to various values of the chemical cross-linked density.
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