Full text loading...
SEM top views of polyacrylate microrod arrays released from macroporous silicon templates taken in the lower secondary electron detection mode at various accelerating voltages . (a) Sample A: polyacrylate PO 77F, . (b) Sample B: polyacrylate PO 77F-MX, . (c) Sample C: polyacrylate LR 9007, . The insets show the corresponding side-views.
Thresholded upper halves of the SEM images shown in Fig. 1. (a) Sample A, (b) sample B, and (c) sample C.
Analysis of the SEM images of samples A–C. (a) Number of recognized microrods as a function of the lower threshold . (b) Slope of the profiles shown in (a). (c) Fractured microrods in sample B merging into the background in the interval marked by arrows in (b). (d) Autocorrelation normalized to the number of considered classes of the profiles of samples A–C that were in turn normalized to unity.
Parameters and WHM quantifying the uniformity of samples A–C.
Article metrics loading...