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Doping modulation in GaN imaged by cross-sectional scanning tunneling microscopy
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10.1063/1.3123258
/content/aip/journal/apl/94/16/10.1063/1.3123258
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/16/10.1063/1.3123258
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Figures

Image of FIG. 1.
FIG. 1.

Cross-sectional empty state constant-current STM image showing a doping-induced contrast modulation along the [0001] direction in GaN. The maxima are marked by arrows. The steps, oriented primarily along the [0001] direction, do not affect the contrast modulation. The image was measured at applied to the sample and 80 pA tunnel current.

Image of FIG. 2.
FIG. 2.

(a) Height profiles of the contrast modulation along the dashed line in Fig. 1. The profiles were acquired at different voltages and with three different tip configurations. The profiles are offset for clarity. Inset: rms roughness of the height profiles for different tunneling voltages acquired with tip 1. (b) Si concentration profile used to simulate the height modulation in (c). (c) Calculated height corrugation arising from the relaxation at the GaN cleavage surface of the strain induced by the model Si doping modulation shown in (b).

Image of FIG. 3.
FIG. 3.

Si concentration along the [0001] direction measured by SIMS (circles). The solid line is a smooth for guiding the eye.

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/content/aip/journal/apl/94/16/10.1063/1.3123258
2009-04-22
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Doping modulation in GaN imaged by cross-sectional scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/16/10.1063/1.3123258
10.1063/1.3123258
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