1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Nonthermal origin of electromigration at gold nanojunctions in the ballistic regime
Rent:
Rent this article for
USD
10.1063/1.3124654
/content/aip/journal/apl/94/16/10.1063/1.3124654
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/16/10.1063/1.3124654
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) The evolution of the circuit conductance as a function of the applied voltage . The inset is a scanning electron microscope image of a gold nanojunction sample before applying voltage stress, together with a schematic illustration of the measurement circuit. Time evolutions of the junction conductance and the junction voltage , when (phase I) (b) and (phase II; ballistic regime) (c).

Image of FIG. 2.
FIG. 2.

The critical voltage is plotted as a function of the junction resistance during the entire BJ process for two samples. I and II denote phase I [Fig. 1(b)] and phase II [Fig. 1(c)], respectively.

Image of FIG. 3.
FIG. 3.

A histogram of the critical junction voltage accumulated for the region of (phase II; ballistic regime) for three BJ trials. The major peak around coincide with the self-diffusion potentials of gold atoms reported in the literature () (Refs. 6 and 17). The inset is a schematic illustration for the atom diffusion driven by microscopic kinetic energy transfer from a single conduction electron to a single gold atom.

Image of FIG. 4.
FIG. 4.

Time evolutions of when junction voltage is set below (320 mV) and above (460 mV) the peak in the histogram of .

Loading

Article metrics loading...

/content/aip/journal/apl/94/16/10.1063/1.3124654
2009-04-21
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nonthermal origin of electromigration at gold nanojunctions in the ballistic regime
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/16/10.1063/1.3124654
10.1063/1.3124654
SEARCH_EXPAND_ITEM