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XRD pattern of BMN thin films prepared on Pt-coated sapphire substrates.
Dielectric constant and loss tangent of BMN thin films as a function of frequency ranging from 1 kHz to 1 MHz. The random jumps near 1 MHz may ascribe to the approaching to upper limitation of the test instrument.
Temperature dependent dielectric constant and loss of BMN thin films measured at 100 kHz.
Bias-field dependence of dielectric constant and loss tangent of BMN thin films measured at 100 kHz.
The loops of BMN thin films measured at room temperature.
A comparison of the tunable characteristics of cubic pyrochlore BMN and BZN thin films.
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