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Typical XRD patterns of the (a) LCAMO film grown at and 600 mTorr , and (b) LNAMO films grown at at 800 mTorr . The inset in (a) shows a rocking curve recorded from the (002) reflection of LCAMO films.
Typical in-plane loop of (a) LCAMO films and (b) LNAMO films recorded at 10 K. The top-corner inset of (a) shows the loop of LCAMO films measured at 125 K above and its right-bottom inset shows the corresponding curve at 500 Oe. Inset of (b) shows curve LNAMO films at 500 Oe. axis of insets represents the value of magnetization in
Polarized Raman spectra (a) measured at 300 K in different polarization configurations, (b) measured as a function of temperature in the configuration. Temperature dependence of (c) the peak position and (d) the FWHM for the phonon mode.
(a) The variation in dielectric constant as a function of temperature, and (b) the temperature dependence of the dielectric constant measured under different magnetic fields. The inset in (a) shows as a function of temperature curve.
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