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Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
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10.1063/1.3126053
/content/aip/journal/apl/94/17/10.1063/1.3126053
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/17/10.1063/1.3126053
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Space-time (a) and space-frequency (b) maps of the horizontal electric field component at the waveguide output measured with the terahertz near-field probe along the horizontal axis. The dashed lines show the inner waveguide wall.

Image of FIG. 2.
FIG. 2.

Space-time maps showing temporal distribution of the electric field amplitude for 2.0, 2.3, and 2.6 THz at the waveguide output. Inset: mode profiles (symbols) measured at time window delays A and B for the peak pulse frequency (2.25 THz). The data are normalized to the peak amplitude of the mode . The solid lines show calculated profiles of the horizontal electric field component.

Image of FIG. 3.
FIG. 3.

(a) Bottom panel: spatial electric field distribution at measured at the output of the waveguide using the terahertz near-field probe; top panel: the corresponding space-time map showing the pulse waveform along the horizontal axis. (b) Similar measurements on a waveguide with the same dimensions however without the dielectric layer.

Image of FIG. 4.
FIG. 4.

Terahertz pulse waveforms measured in the near-field and the far-field regions. Near-field waveforms are detected by the near-field probe. Angle-resolved waveforms are detected by a photoconductive antenna in the far-field zone. The top waveform shows the input pulse measured by the near-field probe. The schematic diagram shows details of the experimental setup.

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/content/aip/journal/apl/94/17/10.1063/1.3126053
2009-04-28
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/17/10.1063/1.3126053
10.1063/1.3126053
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