banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

Space-time (a) and space-frequency (b) maps of the horizontal electric field component at the waveguide output measured with the terahertz near-field probe along the horizontal axis. The dashed lines show the inner waveguide wall.

Image of FIG. 2.
FIG. 2.

Space-time maps showing temporal distribution of the electric field amplitude for 2.0, 2.3, and 2.6 THz at the waveguide output. Inset: mode profiles (symbols) measured at time window delays A and B for the peak pulse frequency (2.25 THz). The data are normalized to the peak amplitude of the mode . The solid lines show calculated profiles of the horizontal electric field component.

Image of FIG. 3.
FIG. 3.

(a) Bottom panel: spatial electric field distribution at measured at the output of the waveguide using the terahertz near-field probe; top panel: the corresponding space-time map showing the pulse waveform along the horizontal axis. (b) Similar measurements on a waveguide with the same dimensions however without the dielectric layer.

Image of FIG. 4.
FIG. 4.

Terahertz pulse waveforms measured in the near-field and the far-field regions. Near-field waveforms are detected by the near-field probe. Angle-resolved waveforms are detected by a photoconductive antenna in the far-field zone. The top waveform shows the input pulse measured by the near-field probe. The schematic diagram shows details of the experimental setup.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy