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Illustration of the cross sections of the sample used in the experiments. A lithium niobate crystal with a stripe surface domain (depth ) is wedge polished at an angle . At the center of the domain the crystal is damaged due to high laser irradiation during the fabrication process.
HF-etched wedge-polished sample imaged with scanning electron microscopy. The dashed line indicates the position of the edge caused by the wedge polishing.
Schematic (a) of the domain configuration at the limits of the pole-inhibited surface domain. The termination of the domain is not sharp resulting in a grainy domain structure as it can be seen in the PFM image (b). Image size is .
Topography (a) and simultaneously recorded piezoresponse (b) of the wedge-polished sample shown in Fig. 2. Section (c) shows a schematic of the PFM image with four distinct areas marked. A: damaged region, B: full contrast PFM response corresponding to a -face, C: reduced PFM response, and D: surrounding uniform domain (-face) area. The dashed lines indicate the position of the edge owing to wedge polishing. For representation purposes, the wedge has been subtracted from the topography image. Image size is .
Scan-lines across the PFM image of Fig. 4(b), one line passes through the damaged area (black •) while the other line does not (gray ×). The letters indicate the areas shown in Fig. 4(c). The curve is the result of the simulation.
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