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Tip-enhanced two-photon excited fluorescence microscopy with a silicon tip
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View: Figures


Image of FIG. 1.
FIG. 1.

Experimental system configuration. P: polarizer, NDF: neutral density filter, BE: beam expander, DM: dichroic mirror, EF: edge filter, SPF: short pass filter, CCD: charge-coupled device, APD: avalanche photodiode, and PC: computer.

Image of FIG. 2.
FIG. 2.

(a) Typical two-photon excited fluorescence spectrum of QD and (b) two-photon excited fluorescence image (without a silicon tip) under azimuthal polarization illumination. The scan area and incident laser power are and , respectively. Each pixel consists of counts/30 ms in intensity and 50 nm/pixel in size. The dashed square is the area observed in Fig. 3.

Image of FIG. 3.
FIG. 3.

Zoomed two-photon excited fluorescence image under (a) azimuthal and (b) radial polarization illumination. [(c) and (d)] are tip-enhanced fluorescence images under radial polarization and topographic image, respectively. The scan area is the same for all images. The incident laser power and the scan step are and 10 nm/pixel, respectively. The units of the inset scale bars are “counts/30 ms” and “nanometer” for fluorescence and topographic images, respectively.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Tip-enhanced two-photon excited fluorescence microscopy with a silicon tip