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(a) CL of Zn recorded on ZnO sample, and (b) CL of Ni recorded on NiO sample. (c) The valence-band edge (VBE) spectra for ZnO and NiO samples. All peaks have been fitted to Voigt line shapes and the VBM values are determined by liner extrapolation of the leading edge to the base line.
CLs of Zn and Ni in the heterojunction.
XRD pattern of the NiO thin film on the sapphire substrate.
Schematic diagram of type-II band alignment of a ZnO/NiO heterojunction.
Peak positions of CL and VBM positions used to calculate the VBO of heterojunction.
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