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X-ray photoelectron spectroscopy measurement of heterostructure valence-band offset
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10.1063/1.3072367
/content/aip/journal/apl/94/2/10.1063/1.3072367
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/2/10.1063/1.3072367

Figures

Image of FIG. 1.
FIG. 1.

(a) CL of Zn recorded on ZnO sample, and (b) CL of Ni recorded on NiO sample. (c) The valence-band edge (VBE) spectra for ZnO and NiO samples. All peaks have been fitted to Voigt line shapes and the VBM values are determined by liner extrapolation of the leading edge to the base line.

Image of FIG. 2.
FIG. 2.

CLs of Zn and Ni in the heterojunction.

Image of FIG. 3.
FIG. 3.

XRD pattern of the NiO thin film on the sapphire substrate.

Image of FIG. 4.
FIG. 4.

Schematic diagram of type-II band alignment of a ZnO/NiO heterojunction.

Tables

Generic image for table
Table I.

Peak positions of CL and VBM positions used to calculate the VBO of heterojunction.

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/content/aip/journal/apl/94/2/10.1063/1.3072367
2009-01-14
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/2/10.1063/1.3072367
10.1063/1.3072367
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