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The polytypic transition in SiC as revealed by diffuse x-ray scattering
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View: Figures


Image of FIG. 1.
FIG. 1.

Reciprocal space maps including the (002) and (113) reflections of corresponding to sample 1 (a), sample 2 (b), and sample 3 (c). The scale bar, shown in (b), is given reciprocal lattice units (i.e., in units of ). For sample 1 the reflections are indicated by the dashed circles. Insets (d) and (e) are magnifications in reversed contrast of the (002) reflection evidencing the diffuse streaks. The streak labeled “PSD” is due to the transmittance function of the PSD. In all cases the intensity is plotted logarithmically. Inset (f) is a schematic representation of the scattering geometry. The area scanned in reciprocal space is shown as the gray rectangle and the spheres correspond to the reflections of . and are the wave vectors of the incident and the scattered radiation.

Image of FIG. 2.
FIG. 2.

(a) Intensity distribution along the row. The labels (1–3) correspond to sample 1–3, respectively. The black curves (black circles) correspond to the experimental data. The gray curves are the calculated intensity profiles with the dislocation-based model (squares) and the layer displacement model (diamond). The curves are shifted vertically for clarity. The dashed arrows indicate features in the diffuse scattering structure that are perfectly reproduced with the dislocation-based model and that the layer displacement model fails to reproduce. (b) Enlarged view of the region evidencing the quality of the simulation (black circles: experimental data; gray line: simulation with the dislocation model).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The 3C-6H polytypic transition in SiC as revealed by diffuse x-ray scattering