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Electronic properties of nanocrystalline and conductive films grown on silicon substrates determined by infrared to ultraviolet reflectance spectra
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10.1063/1.3148339
/content/aip/journal/apl/94/22/10.1063/1.3148339
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/22/10.1063/1.3148339
/content/aip/journal/apl/94/22/10.1063/1.3148339
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/content/aip/journal/apl/94/22/10.1063/1.3148339
2009-06-01
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electronic properties of nanocrystalline LaNiO3 and La0.5Sr0.5CoO3 conductive films grown on silicon substrates determined by infrared to ultraviolet reflectance spectra
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/22/10.1063/1.3148339
10.1063/1.3148339
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