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(a) Schematic of the Kretschmann configuration for the SEW coupling and detection. (b) Calculated normalized reflectivity map of the 1D PC illuminated in the Kretschmann configuration. Darker regions indicate lower reflectance. SEW dispersion curve is indicated by the arrow. (c) Calculated reflectivity angular spectrum for the 1D PC grown optimized for the 532 nm excitation of SEW. The excitation wavelength is 532 nm. The coupling angle is marked with an arrow and estimated as .
SEW spatial distribution imaged by collecting (a) the light scattered by microdefects on the 1D PC surface and (b) the fluorescence emitted by organic dyes on the 1D PC surface. (c) Fluorescence intensity profile along the SEW propagation direction.
Fluorescence spectra of Rhodamine 6G on the surface of 1D PC for TE (solid line) and TM (dot line) polarization of the incident light. SEW is only coupled for a TE-polarized incident light. Inset. Time variations of the fluorescence intensity measured at for TE (filled circles) and TM (open circles) polarized laser excitation caused by the dye molecules photobleaching.
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