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The diffuse reflectance spectra of STO (red circles) and SHTO (blue diamonds) powders. The spectra were converted from reflection to absorbance using the Kubelka–Munk function and the optical band gap energy was then calculated by linear extrapolation of the absorption edge.
(a) Main figure shows XRD pattern of SHTO film deposited on a (001) SNTO substrate. Peaks from the substrate are marked by arrows. The inset shows the Rietveld fit of powder XRD data from bulk SHTO (space group , ) at room temperature. Observed data (crosses) and calculated data (solid line) are shown at top, reflection tick marks, and refinement difference profile shown below. (b) AFM image of the SHTO film deposited on the (001) Nb-STO substrate.
Main figure shows XRR curve for the SHTO film grown on SNTO substrate. Upper inset shows XRD -scans recorded around the (−103) reflection of SNTO (s) and SHTO (f). Lower inset shows the final RHEED image of the SHTO film along the  directions.
The relative permittivity (red circles) and loss tangent (blue diamonds) dependence on the measurement frequency are shown in (a). (b) Shows leakage current density (red circles) and the relative permittivity (blue stars) of the 96.2 nm thick SHTO film (at 100 kHz) as a function of applied electric field.
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