banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High permittivity films grown by pulsed laser deposition
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

The diffuse reflectance spectra of STO (red circles) and SHTO (blue diamonds) powders. The spectra were converted from reflection to absorbance using the Kubelka–Munk function and the optical band gap energy was then calculated by linear extrapolation of the absorption edge.

Image of FIG. 2.
FIG. 2.

(a) Main figure shows XRD pattern of SHTO film deposited on a (001) SNTO substrate. Peaks from the substrate are marked by arrows. The inset shows the Rietveld fit of powder XRD data from bulk SHTO (space group , ) at room temperature. Observed data (crosses) and calculated data (solid line) are shown at top, reflection tick marks, and refinement difference profile shown below. (b) AFM image of the SHTO film deposited on the (001) Nb-STO substrate.

Image of FIG. 3.
FIG. 3.

Main figure shows XRR curve for the SHTO film grown on SNTO substrate. Upper inset shows XRD -scans recorded around the (−103) reflection of SNTO (s) and SHTO (f). Lower inset shows the final RHEED image of the SHTO film along the [110] directions.

Image of FIG. 4.
FIG. 4.

The relative permittivity (red circles) and loss tangent (blue diamonds) dependence on the measurement frequency are shown in (a). (b) Shows leakage current density (red circles) and the relative permittivity (blue stars) of the 96.2 nm thick SHTO film (at 100 kHz) as a function of applied electric field.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High permittivity SrHf0.5Ti0.5O3 films grown by pulsed laser deposition