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Schematic of the experimental setup for measuring the phases sampled by a MP plate, which is located in the front focal plane of a Fourier lens and the detector plane is at the back focal plane.
(a) An example of a MP plate with seven pinholes. (b) Far-field diffraction intensity pattern when the MP plate is illuminated by an optical vortex with . (c) Amplitude distribution of the Fourier transform of the intensity pattern shown in (b). (d) Phase distribution of the Fourier transform. The vertices of the polygon shown in [(c) and (d)] indicate the positions, from which we can extract the relative phase values passed through the pinholes.
(a) Example of measured intensity distributions. (b) The measured phase values extracted from the Fourier transform of the intensity patterns.
Phase distribution of the optical vortex with on the multiple pinholes. Here, the singular point does not coincide with the center of the ring, where and are the displacements in horizontal and vertical directions, respectively.
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