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Low-threshold ablation of dielectrics irradiated by picosecond soft x-ray laser pulses
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10.1063/1.3152290
/content/aip/journal/apl/94/23/10.1063/1.3152290
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/23/10.1063/1.3152290

Figures

Image of FIG. 1.
FIG. 1.

(a) The experimental set up for recording the Ag XRL beam patterns near the best focus position on a LiF crystal. (b) The patterns recorded on LiF crystal at −3 mm to from the best focus position. (c) The images of XRL beam focusing spot on a LiF crystal obtained with (left, energy , intensity ) and without (right, energy , intensity ) Zr filter.

Image of FIG. 2.
FIG. 2.

(a) The magnified image of XRL beam focusing spot, obtained on the surface of LiF crystal without Zr filter. (b) Enlarged part of the image with marked ablation spot. (c) The image of the same spot obtained by visible microscope. (d) Traces and image of the same spot measured by the AFM.

Image of FIG. 3.
FIG. 3.

(a) The magnified image of XRL beam focusing spot, obtained on the surface of LiF crystal with Zr filter after three shots with energy of . (b) Image of the same spot obtained by visible microscope. (c) Trace and image of ablative spot measured by the AFM.

Tables

Generic image for table
Table I.

Laser ablation thresholds of LiF crystals, irradiated by different laser sources.

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/content/aip/journal/apl/94/23/10.1063/1.3152290
2009-06-08
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-threshold ablation of dielectrics irradiated by picosecond soft x-ray laser pulses
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/23/10.1063/1.3152290
10.1063/1.3152290
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