Full text loading...
The 3D schematic indicating the as-grown ferroelastic and ferroelectric domain structure of the film. is represented by red arrows for two domain variants and and shaded area represents domain wall. The domains are tilted oppositely by . The substrate is represented with an orientation matched monoclinic unit cell. All angular distortions are exaggerated for clarity. Beneath are approximately collinear orthorhombic and pseudocubic coordinates systems.
AFM topography (a) of a film on substrate and a dark field TEM cross section (b) of the film on substrate. A high resolution image is shown of a vertical domain boundary (c) (marked with arrows).
Detailed RSM maps near the and reflections at two orthogonal in-plane sample orientations [ (a) and (b)]. The angle is a measure of domain tilting due to domain wall coherency. Below are two off-axis RSMs measured at (c) and at (d).
Phase field simulation of on exhibiting the same stripe- vertical domain walls observed experimentally.
Article metrics loading...