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Optical near-field probe with embedded gallium scattering center
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10.1063/1.3157909
/content/aip/journal/apl/94/25/10.1063/1.3157909
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/25/10.1063/1.3157909
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Formation of the sharp dielectric tip: (a) shape of the probe after heat and pull method; (b) shape of the probe tip before application of FIB; (c) tip shape after 40 s of FIB illumination; and (d) tip shape after 60 s of FIB illumination.

Image of FIG. 2.
FIG. 2.

(a) High resolution secondary electron micrograph of the probe tip and (b) visualization of the material density by measuring the number of transmitted electrons when 30 keV electron beam is scanning across the tip.

Image of FIG. 3.
FIG. 3.

Comparison of different probe through imaging of a polished waveguide: (a) overlaid optical and topography images recorded with Ga enhanced tip; overlaid optical and topography images recorded with a simple glass tip; (c) line profiles of the waveguide across line ; and (d) line profiles of the waveguide across line . For the glass tip amplified line profiles are also presented for comparison.

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/content/aip/journal/apl/94/25/10.1063/1.3157909
2009-06-23
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical near-field probe with embedded gallium scattering center
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/25/10.1063/1.3157909
10.1063/1.3157909
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