Full text loading...
(a) Resistance of sample A as a function of temperature measured in a four-terminal configuration. The solid line represents a linear fit at higher temperatures. (b) Normalized conductance fluctuations of sample A in units of as a function of magnetic field and temperature. The curve on the left side shows the conductance fluctuations at 0.35 K.
(a) vs of sample A measured in a two- and four-terminal configurations (squares), respectively. The solid lines represent the fitted temperature dependence. Also shown are the rms values obtained from Eq. (1) by using extracted from (dots). The inset shows an electron beam micrograph of the sample. (b) vs of sample A (squares). Above 1.5 K increases as (dashed line). For comparison determined for sample B is also shown (triangles). (c) determined from for sample A (squares) and sample B (triangles), respectively. The dashed line represents the fitted decrease in for sample A while the solid line represents .
Conductance fluctuations of sample A in units of as a function of magnetic field at 0.5 K: (a) comparison of the four-terminal and two-terminal magnetoconductances; (b) symmetric and antisymmetric contributions of the conductance fluctuations measured in a two-terminal configuration; (c) symmetric and antisymmetric contributions of the corresponding four-terminal configuration; and (d) fast Fourier transforms of the conductance fluctuations. The inset shows the schematics of the four-terminal (left) and two-terminal (right) measurement configurations.
Article metrics loading...