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Planar view of the transistor array (a) and a vertical schematic cross section of the ferroelectric field effect transistor (b).
Retention behavior of the drain current at a source-drain voltage of after a programming pulse of . The dashed line shows an exponential decay with a time constant of .
A full piezoelectric polarization loop (a) and loop measured 24 h after programming of the on state (b): The voltage has been applied to the source-drain channel (at grounded gate). The open loop (b) indicates that the polarization remains stable within 24 h and retention loss is therefore not associated with the depolarization effects.
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