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Electron inelastic mean free paths for carbon nanotubes from optical data
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10.1063/1.3167819
/content/aip/journal/apl/94/26/10.1063/1.3167819
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/26/10.1063/1.3167819
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The parameterization of the Kuzuo (Ref. 11) and NIST (Ref. 20) data using Eq. (1) (the fit to the MWCNT data of Ref. 10 was of similar quality).

Image of FIG. 2.
FIG. 2.

Comparison of our dispersion relations [Eqs. (2)–(4)] with experimental data for the on bulk SWCNT samples (Ref. 26) and VASWCNTs (Ref. 27).

Image of FIG. 3.
FIG. 3.

Calculated electron IMFPs for different CNT systems using Eqs. (1)–(4). IMFPs using the TPP-2M formula (Ref. 33) and the NIST SRD71 database (Ref. 34) are also presented.

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/content/aip/journal/apl/94/26/10.1063/1.3167819
2009-07-02
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron inelastic mean free paths for carbon nanotubes from optical data
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/26/10.1063/1.3167819
10.1063/1.3167819
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