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SEM [(a) and (d)] and TEM images [low magnification: [(b) and (e)] and high resolution: [(c) and (f)]] of ZnO NWs grown on two different types of substrates. The insets of (c) and (f) show fast Fourier transformation patterns corresponding to the lattice fringes from the NWs.
(a) PL intensity ratios and spectra (inset) at room temperature, (b) PL contour plot of temperature-dependent defect emissions, and (c) PL spectra (at ) of the defect emissions of ZnO NWs grown on two different substrates. (d) Temperature dependence of intensity of the defect emission band. The solid lines show the results of parameter fitting to Eq. (1).
Temperature-dependent PL spectra of UV emissions showing the excitons and their LO-phonon replicas for ZnO NWs grown on two different substrates (see text for details).
(a) Temperature dependence of FX peak position. The solid lines are the fitting curves of the experimental data by Varshni’s formula [Eq. (2)]. (b) Lorentzian curves for the room-temperature UV emissions showing the contributions from the FX, F1, and F2 emission curves. The sums of the three Lorentzians are indicated by the solid curves (red).
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