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Impact of near-surface defects and morphology on ZnO luminescence
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10.1063/1.3077015
/content/aip/journal/apl/94/4/10.1063/1.3077015
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/4/10.1063/1.3077015
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

DRCLS spectra of (a) high and (b) lower near-surface defect ZnO and order-of-magnitude changes with depth in deep level defect emission.

Image of FIG. 2.
FIG. 2.

AFM morphology maps (a) and (b) corresponding to hydrothermal-16 and hydrothermal-1 , respectively, in Figs. 1(a) and 1(b). KPFM potential maps (c) and (d) acquired simultaneously with AFM maps (a) and (b), respectively.

Image of FIG. 3.
FIG. 3.

The ratio of NBE to deep level defect intensities for , for hydrothermal, melt-grown, and vapor phase transport-grown ZnO as a function of AFM (a) average roughness and (b) rms roughness displays a well defined threshold dependence that increases rapidly for average roughness and rms roughness .

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/content/aip/journal/apl/94/4/10.1063/1.3077015
2009-01-30
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Impact of near-surface defects and morphology on ZnO luminescence
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/4/10.1063/1.3077015
10.1063/1.3077015
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