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(a) XRD patterns for the as-deposited and annealed thin films. RSMs at around 301 diffraction are displayed for the (b) as-deposited and (c) annealed thin films.
(a) Atomic force microscopy image for the annealed thin film grown on (001) substrate. (b) Cross-sectional profile of the image along the solid line indicated in (a).
(a) CEMS spectra for the as-deposited and annealed thin films (dots). The solid lines represent the least-squares fits using two Lorentzians. (b) M–T curves for the as-deposited (closed circles) and annealed (open squares) thin films under applied along the direction. For both films, the ZFC and FC data fall on the same curve. The of the annealed film is multiplied by a factor of 3 for clarity.
(a) M–T curves for annealed thin film at (open squares), 1000 (open circles), and 20 000 Oe (open triangles) applied along the direction. (b) –T curves for the as-deposited thin film at and . The ac frequencies are 1, 10, 100, and 300 Hz. The inset represents the low-temperature data of the M–T curve for as-deposited film as shown in Fig. 3(b). The arrow denotes an inflection point. (c) Magnetic field dependence of at 2 K for the as-deposited (closed circles) and annealed (open squares) thin films. (d) Enlarged view of (c).
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