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XRD patterns of powder and sintered ceramics.
SEM micrographs of sintered ceramics: (a) BFO-600 and (b) BFO-700 samples.
Frequency dependence of of BFO-700 at different temperatures; the solid curves are the best fit to Eq. (1). Insets (a) and (b) show dielectric spectrum of BFO-600 and Arrhenius plots of the relaxation times for the LTDR and MTDR, respectively.
Frequency dependence of of BFO-700 sample at various temperature ranges of the relaxations: (a) LTDR, (b) MTDR, and (c) HTDR; [(b) and (c)] are the enlarged parts of dashed rectangle areas in (a) and (b), respectively. The first relaxation peak of of (a), (b), and (c) are measured at temperatures −50, 30, and , respectively, and each step increase in measured temperature is . The inset of (c) shows three peak frequencies as a function of temperature for LTDR, MTDR, and HTDR.
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