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In situ extended x-ray absorption fine structure study of initial processes in CdSe nanocrystals formation using a microreactor
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24.At point D the edge jump slightly increases with repeated scans, indicating a weak pileup of CdSe nanocrystals on the tube surface. This pileup increases the percentage of Se in the CdSe nanocrystals and correspondingly reduces the Se–P peak intensity. To correct this effect, the observed Se–P peak intensity was multiplied by the ratio , where is the edge jump of the averaged scan and is the extrapolated edge jump of the starting material.
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