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XRD pattern of the thin film. Inset: Hysteresis loop ( curve) of the same film measured at RT.
edge NEXAFS and XLD spectra of thin film collected in both TEY and TFY modes at RT. The inset shows the experimental geometry used for the experiment.
edge NEXAFS and XMCD spectra of thin film collected at RT: (a) TEY mode, (b) TFY mode. The energy integrals of XMCD spectra are also shown. The inset in the (b) shows a schematic energy diagram and possible electron configuration.
NEXAFS and XMCD spectra of thin film collected in TEY mode at RT.
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