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Point defects in sputtered NiO films
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10.1063/1.3081025
/content/aip/journal/apl/94/6/10.1063/1.3081025
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/6/10.1063/1.3081025

Figures

Image of FIG. 1.
FIG. 1.

SIMS depth profiles of double-layer NiO films.

Image of FIG. 2.
FIG. 2.

XRD patterns of the sputtered NiO films annealed in nitrogen atmosphere after annealing at (a) 100, (b) 200, (c) 300, (d) 400, and (e) .

Image of FIG. 3.
FIG. 3.

The -edge XANES spectra of the sputtered NiO films annealed at various temperatures. The inset shows the same XANES spectra with a broader photon energy range.

Image of FIG. 4.
FIG. 4.

The -weighted Fourier transformed EXAFS spectra of the NiO annealed at various temperatures. The experimental data are the solid lines and the best fittings are the open circles.

Tables

Generic image for table
Table I.

Bond distances and coordination of the two shells around Ni in the NiO films with various annealing temperatures.

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/content/aip/journal/apl/94/6/10.1063/1.3081025
2009-02-10
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Point defects in sputtered NiO films
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/6/10.1063/1.3081025
10.1063/1.3081025
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