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SIMS depth profiles of double-layer NiO films.
XRD patterns of the sputtered NiO films annealed in nitrogen atmosphere after annealing at (a) 100, (b) 200, (c) 300, (d) 400, and (e) .
The -edge XANES spectra of the sputtered NiO films annealed at various temperatures. The inset shows the same XANES spectra with a broader photon energy range.
The -weighted Fourier transformed EXAFS spectra of the NiO annealed at various temperatures. The experimental data are the solid lines and the best fittings are the open circles.
Bond distances and coordination of the two shells around Ni in the NiO films with various annealing temperatures.
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