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SEM micrographs of typical STFs prepared for this study: (a) side view of Au-nanorod STF, (b) top view of (a), (c) top view of 5 nm Ag layer deposited on top of Si nanorods, (d) top view of Cu STFs, (e) top view of Si nanohelices deposited on Au dots, and (f) side view of (e). These films were prepared at the Institut für Oberflächenmodifizierung (IOM).
Fluorescence images from (a) Ag-nanorod STF and (b) a dense Ag film immersed in an aqueous solution of luminescent E. coli. (c) Typical SEF spectra from a Ag-nanorod STF and an Al-nanorod STF and from the corresponding reference films. Inset: SEM micrograph of a Ag-nanorod STF showing the highest enhancement factor.
STF samples used, their geometric attributes, and the measured enhancement factors EF. FS: fused silica, Sub.: substrate. Ag–Si 1/2: 5–15 nm Ag on Si rods. Si spirals 1: Si spirals on 30 nm Au dots. Si spirals 2: Si spirals on 350 nm spheres.
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