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Strain-controlled electronic properties and magnetorelaxor behaviors in electron-doped thin films
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10.1063/1.3082091
/content/aip/journal/apl/94/6/10.1063/1.3082091
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/6/10.1063/1.3082091
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) RHEED intensity oscillation observed during the deposition of CCMO5 thin film on NAO substrate. (b) AFM images for CCMO5 films grown on LAO, YAO, STO, and NAO substrates.

Image of FIG. 2.
FIG. 2.

(a) In-plane (square) and out-of-plane (circle) lattice constants of CCMO5 thin film deposited on YAO, NAO, LAO, and STO substrates. (b) Temperature dependence of the resistivity for CCMO5 films deposited on YAO, NAO, LAO, and STO substrates measured in magnetic fields of 0 T (solid lines) and 5 T (dotted lines).

Image of FIG. 3.
FIG. 3.

Temperature dependence of the resistivity for nondoped CMO and CCMO thin films with , 0.05, 0.06, and 0.08 (CCMO4, CCMO5, CCMO6, and CCMO8, respectively) deposited on the NAO substrate measured in magnetic fields of 0 and 5 T.

Image of FIG. 4.
FIG. 4.

Magnetoresistance under the successive runs of magnetic-field application [±3 T (solid lines) and ±9 T (dotted lines)] at 5 K for CCMO4, CCMO5, and CCMO6 thin films on NAO substrate. The insets are schematic images for the and phases which vary with the magnetic field scan.

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/content/aip/journal/apl/94/6/10.1063/1.3082091
2009-02-13
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Strain-controlled electronic properties and magnetorelaxor behaviors in electron-doped CaMnO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/6/10.1063/1.3082091
10.1063/1.3082091
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