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(a) RHEED intensity oscillation observed during the deposition of CCMO5 thin film on NAO substrate. (b) AFM images for CCMO5 films grown on LAO, YAO, STO, and NAO substrates.
(a) In-plane (square) and out-of-plane (circle) lattice constants of CCMO5 thin film deposited on YAO, NAO, LAO, and STO substrates. (b) Temperature dependence of the resistivity for CCMO5 films deposited on YAO, NAO, LAO, and STO substrates measured in magnetic fields of 0 T (solid lines) and 5 T (dotted lines).
Temperature dependence of the resistivity for nondoped CMO and CCMO thin films with , 0.05, 0.06, and 0.08 (CCMO4, CCMO5, CCMO6, and CCMO8, respectively) deposited on the NAO substrate measured in magnetic fields of 0 and 5 T.
Magnetoresistance under the successive runs of magnetic-field application [±3 T (solid lines) and ±9 T (dotted lines)] at 5 K for CCMO4, CCMO5, and CCMO6 thin films on NAO substrate. The insets are schematic images for the and phases which vary with the magnetic field scan.
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