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Reversible changes of epitaxial thin films from perovskite to infinite-layer structure
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10.1063/1.3078276
/content/aip/journal/apl/94/8/10.1063/1.3078276
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/8/10.1063/1.3078276
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Crystal structures of (a) , (b) , and (c) .

Image of FIG. 2.
FIG. 2.

XRD patterns in logarithmic scales of (a) thin film grown on substrate, (b) thin film obtained from a thin film by a 30 min reduction with , and (c) epitaxial thin film obtained from a thin film by 2 h reduction with . Diffraction peaks of the samples were indexed with the simple perovskite structure.

Image of FIG. 3.
FIG. 3.

RSMs around (103) Bragg reflection of (a) perovskite thin film grown on substrate and (b) infinite-layer-structure epitaxial thin film.

Image of FIG. 4.
FIG. 4.

XAS near the edge of and thin films.

Image of FIG. 5.
FIG. 5.

XRD patterns in logarithmic scales of thin film grown on substrate (bottom), reduced thin film (middle), and reoxidized thin film (top). The inset shows the RSM around the (103) Bragg reflection for the reoxidized thin film.

Image of FIG. 6.
FIG. 6.

Temperature dependence of resistivity (measured along the in-plane direction) of thin film grown on substrate, , , and reoxidized thin films.

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/content/aip/journal/apl/94/8/10.1063/1.3078276
2009-02-24
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reversible changes of epitaxial thin films from perovskite LaNiO3 to infinite-layer structure LaNiO2
http://aip.metastore.ingenta.com/content/aip/journal/apl/94/8/10.1063/1.3078276
10.1063/1.3078276
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