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PL spectra of with and without the SFs. Inset shows the monochromatic micro-PL mapping at wavelength of 480 nm.
Micrograph of the sample surface after KOH etching. Round-shaped pits represent threading edge dislocations. Oval-shaped pits represent basal plane dislocations.
(a) Bright-field TEM image and (b) high-resolution lattice image of a cross section of epilayer with a SF.
Schematic of the stacking sequences of the Shockley type SFs viewed from the direction. Stacking sequences are illustrated in terms of the and Zhdanov’s notations.
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