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XRD patterns of BST thin films with the thickness ranging from 160 to 1000 nm: (a) symmetric (001) scans and (b) asymmetric (011) scans. Arrows indicate the peak positions for the bulk .
(a) Lattice parameters ( and ) and ratio, (b) strain of epitaxial BST thin films as a function of the film thickness.
hysteresis loops of BST thin films with various thicknesses measured at 300 K.
Out-of-plane dielectric constant in strained BST films as a function of temperature and film thickness. The inset is the dielectric constant as a function of the ratio at 300 K.
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