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Effect of large strain on dielectric and ferroelectric properties of thin films
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10.1063/1.3151961
/content/aip/journal/apl/95/1/10.1063/1.3151961
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3151961
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of BST thin films with the thickness ranging from 160 to 1000 nm: (a) symmetric (001) scans and (b) asymmetric (011) scans. Arrows indicate the peak positions for the bulk .

Image of FIG. 2.
FIG. 2.

(a) Lattice parameters ( and ) and ratio, (b) strain of epitaxial BST thin films as a function of the film thickness.

Image of FIG. 3.
FIG. 3.

hysteresis loops of BST thin films with various thicknesses measured at 300 K.

Image of FIG. 4.
FIG. 4.

Out-of-plane dielectric constant in strained BST films as a function of temperature and film thickness. The inset is the dielectric constant as a function of the ratio at 300 K.

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/content/aip/journal/apl/95/1/10.1063/1.3151961
2009-07-08
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of large strain on dielectric and ferroelectric properties of Ba0.5Sr0.5TiO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3151961
10.1063/1.3151961
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