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XRD patterns of PZT/SRO thin films on , with PZT(110) (a) and PZT(001) (c) orientation respectively. -scan profiles of SRO(002) and Si(202) reflections of the PZT(110) (b) and PZT(001) sample (d). Schematic side and top view of the SRO(110) (e) and SRO(001) (f) configuration (dashed) on (solid) and corresponding -scan rocking curves of PZT(110) and PZT(002) peaks.
hysteresis (a) and loops (b) of PZT(001) and PZT(110) samples at 1 kHz frequency.
Remnant polarization of PZT(001) and PZT(110) samples versus the number of switching cycles at 200 kV/cm amplitude and 1 kHz frequency (a). hysteresis (b) and loops (c) of PZT(001) and PZT(110) samples after .
Positive part of the loop of the PZT(110) sample after 1, , , , and switching cycles (a). Leakage current vs electric field characteristics of PZT(001) and PZT(110) samples at initial stage and after switching cycles (b).
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