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The influence of copper top electrodes on the resistive switching effect in thin films studied by conductive atomic force microscopy
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10.1063/1.3167810
/content/aip/journal/apl/95/1/10.1063/1.3167810
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3167810
/content/aip/journal/apl/95/1/10.1063/1.3167810
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/content/aip/journal/apl/95/1/10.1063/1.3167810
2009-07-09
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The influence of copper top electrodes on the resistive switching effect in TiO2 thin films studied by conductive atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3167810
10.1063/1.3167810
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