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Enhanced transport properties in thin films epitaxially grown on substrates: The profound impact of the oxygen content
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View: Figures


Image of FIG. 1.
FIG. 1.

XRD analysis of on substrate; (upper) HL map around (002) symmetric reflection; (lower) HL map around (103) asymmetric reflection (in the inset the azimuthal -scan is also reported, showing the in-plane fourfold symmetry.

Image of FIG. 2.
FIG. 2.

Resistivity vs temperature behavior for a -thick film. The low-temperature metallic FM power-law (magenta) fitting curves is also reported. In the inset, the metal-insulator transition temperature for different annealing process (keeping fixed the duration at 54 h and by changing the temperature ) is also reported. Data refer to three sets of LMO samples, with La/Mn stoichiometric ratio of 0.88 (red squares), 0.98 (green circles), and 1.07 (blue triangles), respectively.

Image of FIG. 3.
FIG. 3.

Resistivity vs temperature behavior for a -thick after the annealing process at high temperature in air (black squares) and after a deoxygenation process in vacuum (red circles). In the inset, spectra of the same LMO film, after the two annealing process. The out-of-plane lattice values are also reported.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhanced transport properties in LaxMnO3−δ thin films epitaxially grown on SrTiO3 substrates: The profound impact of the oxygen content