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XRD patterns for (a) BFO/SRO/DSO and (b) BFO/SRO/STO, where the 002 peaks are amplified in insets and the dashed lines located at 45.770° expected for bulklike BFO.
The curves (open square), their simulations using VEPFIT method (black line for fitting and gray lines for the estimated characteristic of each layer), and the four regions divided by red dot lines of (a) 760-, (b) 0.1-, (c) 0.001-BFO/SRO/DSO, and (d) 760-, (e) 0.1-, and (f) 0.001-BFO/SRO/STO.
The AFM surface images of (a) 760-, (b) 0.1-, (c) 0.001-BFO/SRO/DSO, (d) 760-, (e) 0.1-, and (f) 0.001-BFO/SRO/STO, and the PFM in-plane images of (g) 0.1-BFO/SRO/DSO and (h) 0.1-BFO/SRO/STO, where all images are and all AFM images have a height scale of 5 nm.
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