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The dependence of oxygen vacancy distributions in films on oxygen pressure and substrate
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10.1063/1.3171939
/content/aip/journal/apl/95/1/10.1063/1.3171939
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3171939
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns for (a) BFO/SRO/DSO and (b) BFO/SRO/STO, where the 002 peaks are amplified in insets and the dashed lines located at 45.770° expected for bulklike BFO.

Image of FIG. 2.
FIG. 2.

The curves (open square), their simulations using VEPFIT method (black line for fitting and gray lines for the estimated characteristic of each layer), and the four regions divided by red dot lines of (a) 760-, (b) 0.1-, (c) 0.001-BFO/SRO/DSO, and (d) 760-, (e) 0.1-, and (f) 0.001-BFO/SRO/STO.

Image of FIG. 3.
FIG. 3.

The AFM surface images of (a) 760-, (b) 0.1-, (c) 0.001-BFO/SRO/DSO, (d) 760-, (e) 0.1-, and (f) 0.001-BFO/SRO/STO, and the PFM in-plane images of (g) 0.1-BFO/SRO/DSO and (h) 0.1-BFO/SRO/STO, where all images are and all AFM images have a height scale of 5 nm.

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/content/aip/journal/apl/95/1/10.1063/1.3171939
2009-07-07
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The dependence of oxygen vacancy distributions in BiFeO3 films on oxygen pressure and substrate
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3171939
10.1063/1.3171939
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